Use of a repositionable substrate to acquire and compare distinct atomic force microscope images of a field of microtubules

David C. Turner, Chunyen Chang, Susan L. Brandow, Douglas B. Murphy, Bruce P. Gaber

Research output: Contribution to journalArticle

Abstract

Many scanning probe microscope (SPM) experiments of interest require removing the sample from the scanning head of the SPM for processing or examination by other techniques and then replacing it in the SPM head and relocating the original sample area. For feature sizes below 1 μm this is often a tedious, if not impossible, task. To resolve this problem we have designed a patterned substrate which can be used with any SPM to relocate sub-micrometer features even after removal, and subsequent replacement of the sample in the scanning head. The use of this device with an atomic force microscope (AFM) is demonstrated by imaging a field of chicken brain microtubules with several different AFM probes and scan modes. Contact, Tapping™, and error-signal mode AFM images were acquired using normal pyramidal tips and Park Scientific Ultralevers. Images of individual tubules were obtained with all three imaging modes, allowing direct comparison with respect to height, width and feature resolution.

Original languageEnglish (US)
Pages (from-to)425-434
Number of pages10
JournalUltramicroscopy
Volume58
Issue number3-4
DOIs
StatePublished - 1995

Fingerprint

Microscopes
microscopes
Scanning
Substrates
scanning
probes
Imaging techniques
error signals
chickens
brain
micrometers
Brain
examination
Processing
Experiments

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)

Cite this

Use of a repositionable substrate to acquire and compare distinct atomic force microscope images of a field of microtubules. / Turner, David C.; Chang, Chunyen; Brandow, Susan L.; Murphy, Douglas B.; Gaber, Bruce P.

In: Ultramicroscopy, Vol. 58, No. 3-4, 1995, p. 425-434.

Research output: Contribution to journalArticle

Turner, David C. ; Chang, Chunyen ; Brandow, Susan L. ; Murphy, Douglas B. ; Gaber, Bruce P. / Use of a repositionable substrate to acquire and compare distinct atomic force microscope images of a field of microtubules. In: Ultramicroscopy. 1995 ; Vol. 58, No. 3-4. pp. 425-434.
@article{9d7fb10b8e6a4c3dbeec5b2b627bd014,
title = "Use of a repositionable substrate to acquire and compare distinct atomic force microscope images of a field of microtubules",
abstract = "Many scanning probe microscope (SPM) experiments of interest require removing the sample from the scanning head of the SPM for processing or examination by other techniques and then replacing it in the SPM head and relocating the original sample area. For feature sizes below 1 μm this is often a tedious, if not impossible, task. To resolve this problem we have designed a patterned substrate which can be used with any SPM to relocate sub-micrometer features even after removal, and subsequent replacement of the sample in the scanning head. The use of this device with an atomic force microscope (AFM) is demonstrated by imaging a field of chicken brain microtubules with several different AFM probes and scan modes. Contact, Tapping™, and error-signal mode AFM images were acquired using normal pyramidal tips and Park Scientific Ultralevers. Images of individual tubules were obtained with all three imaging modes, allowing direct comparison with respect to height, width and feature resolution.",
author = "Turner, {David C.} and Chunyen Chang and Brandow, {Susan L.} and Murphy, {Douglas B.} and Gaber, {Bruce P.}",
year = "1995",
doi = "10.1016/0304-3991(95)00009-P",
language = "English (US)",
volume = "58",
pages = "425--434",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "3-4",

}

TY - JOUR

T1 - Use of a repositionable substrate to acquire and compare distinct atomic force microscope images of a field of microtubules

AU - Turner, David C.

AU - Chang, Chunyen

AU - Brandow, Susan L.

AU - Murphy, Douglas B.

AU - Gaber, Bruce P.

PY - 1995

Y1 - 1995

N2 - Many scanning probe microscope (SPM) experiments of interest require removing the sample from the scanning head of the SPM for processing or examination by other techniques and then replacing it in the SPM head and relocating the original sample area. For feature sizes below 1 μm this is often a tedious, if not impossible, task. To resolve this problem we have designed a patterned substrate which can be used with any SPM to relocate sub-micrometer features even after removal, and subsequent replacement of the sample in the scanning head. The use of this device with an atomic force microscope (AFM) is demonstrated by imaging a field of chicken brain microtubules with several different AFM probes and scan modes. Contact, Tapping™, and error-signal mode AFM images were acquired using normal pyramidal tips and Park Scientific Ultralevers. Images of individual tubules were obtained with all three imaging modes, allowing direct comparison with respect to height, width and feature resolution.

AB - Many scanning probe microscope (SPM) experiments of interest require removing the sample from the scanning head of the SPM for processing or examination by other techniques and then replacing it in the SPM head and relocating the original sample area. For feature sizes below 1 μm this is often a tedious, if not impossible, task. To resolve this problem we have designed a patterned substrate which can be used with any SPM to relocate sub-micrometer features even after removal, and subsequent replacement of the sample in the scanning head. The use of this device with an atomic force microscope (AFM) is demonstrated by imaging a field of chicken brain microtubules with several different AFM probes and scan modes. Contact, Tapping™, and error-signal mode AFM images were acquired using normal pyramidal tips and Park Scientific Ultralevers. Images of individual tubules were obtained with all three imaging modes, allowing direct comparison with respect to height, width and feature resolution.

UR - http://www.scopus.com/inward/record.url?scp=0029311284&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029311284&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(95)00009-P

DO - 10.1016/0304-3991(95)00009-P

M3 - Article

AN - SCOPUS:0029311284

VL - 58

SP - 425

EP - 434

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3-4

ER -