The role of intracellular calcium in axonal injury

Raha Dastgheyb, K. A. Barbee, G. Gallo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Increased levels of axonal calcium have been found after Traumatic Brain injury. Calcium can enter the cell from an extracellular source or be released from intracellular stores. Here, we investigate the importance of intracellular calcium in axonal pathology by chelating intracellular calcium and isolating components of the injury pathway such as membrane damage, calcium influx, mitochondrial injury, and increased oxidative stress. The findings were that chelating intracellular calcium with BAPTA-AM was neuroprotective after increasing membrane permeability with melittin, damaging mitochondria with CCCP, and increasing oxidative stress with TbHp. Chelating intracellular calcium was not neuroprotective after injuring cells by selectively increasing axonal calcium with A23187.

Original languageEnglish (US)
Title of host publicationProceedings - 2014 40th Annual Northeast Bioengineering Conference, NEBEC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479937288
DOIs
Publication statusPublished - Dec 2 2014
Externally publishedYes
Event2014 40th Annual Northeast Bioengineering Conference, NEBEC 2014 - Boston, United States
Duration: Apr 25 2014Apr 27 2014

Publication series

NameProceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC
Volume2014-December
ISSN (Print)1071-121X
ISSN (Electronic)2160-7001

Other

Other2014 40th Annual Northeast Bioengineering Conference, NEBEC 2014
CountryUnited States
CityBoston
Period4/25/144/27/14

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ASJC Scopus subject areas

  • Bioengineering

Cite this

Dastgheyb, R., Barbee, K. A., & Gallo, G. (2014). The role of intracellular calcium in axonal injury. In Proceedings - 2014 40th Annual Northeast Bioengineering Conference, NEBEC 2014 [6972768] (Proceedings of the IEEE Annual Northeast Bioengineering Conference, NEBEC; Vol. 2014-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NEBEC.2014.6972768