The relative efficiency of soft-error induction in 4k static rams by muons and pions

J. F. Dicello, C. W. McCabe, J. D. Doss, M. Paciotti

Research output: Contribution to journalArticle

Abstract

Soft-error rates in a 4K static RAM have been obtained for 164 MeV/c pions and 109 MeV/c muons. The pion beams were found to be at least 10000 times more effective than were the muon beams, with the implication that effects of pions in cosmic rays at sea level may not be negligible.

Original languageEnglish (US)
Pages (from-to)4613-4615
Number of pages3
JournalIEEE Transactions on Nuclear Science
Volume30
Issue number6
DOIs
StatePublished - Dec 1983
Externally publishedYes

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'The relative efficiency of soft-error induction in 4k static rams by muons and pions'. Together they form a unique fingerprint.

  • Cite this