It is shown that energy deposited by external radiation in a simulated critical site, analogous to that of an integrated circuit, can be significantly altered by changing its shape as well as the magnitude of the volume, area or thickness. By a judicious choice of the shape of a sensitive site, the relative numbers of critical events can be reduced significantly without an increase in the volume of the device. Probability distributions for energy deposition (microdosimetric spectra) in a unit-density plastic volume have been calculated for exposures to monoenergetic neutrons with energies of 1 and 14 MeV to illustrate the dependency on shape as well as volume of both the distributions of events and the mean energies deposited.
ASJC Scopus subject areas
- Nuclear and High Energy Physics