Abstract
One of the most efficient ways of delivering mid-infrared (2.5μm<λ<20μm) radiation from a source (laser beam, black body or biological tissue), to a detector, through straight or bent trajectories, is a hollow waveguide. The infrared radiation is guided through the bore of waveguide by multiple reflections and refraction from metal and dielectric thin films respectively. One of the factors that determine the transmission of the hollow waveguide, is the surface roughness, which causes scattering. To find how does the roughness affects the transmission of the waveguide, we measured the surface roughness using an atomic force microscope (AFM) and developed a new ray model, which predicts the transmission and the beam shape delivered by the waveguide.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 23-30 |
| Number of pages | 8 |
| Journal | Journal of Optoelectronics and Advanced Materials |
| Volume | 1 |
| Issue number | 3 |
| State | Published - 1999 |
| Externally published | Yes |
Keywords
- Atomic force microscopy
- Infrared transmission
- Roughness
- Waveguide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering