The effect of scattering on the transmission of infrared radiation through hollow waveguides

M. Ben-David, A. Inberg, I. Gannot, N. Croitoru

Research output: Contribution to journalArticlepeer-review

Abstract

One of the most efficient ways of delivering mid-infrared (2.5μm<λ<20μm) radiation from a source (laser beam, black body or biological tissue), to a detector, through straight or bent trajectories, is a hollow waveguide. The infrared radiation is guided through the bore of waveguide by multiple reflections and refraction from metal and dielectric thin films respectively. One of the factors that determine the transmission of the hollow waveguide, is the surface roughness, which causes scattering. To find how does the roughness affects the transmission of the waveguide, we measured the surface roughness using an atomic force microscope (AFM) and developed a new ray model, which predicts the transmission and the beam shape delivered by the waveguide.

Original languageEnglish (US)
Pages (from-to)23-30
Number of pages8
JournalJournal of Optoelectronics and Advanced Materials
Volume1
Issue number3
StatePublished - 1999
Externally publishedYes

Keywords

  • Atomic force microscopy
  • Infrared transmission
  • Roughness
  • Waveguide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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