Tandem Time-of-Flight Mass Spectrometry with a Curved Field Reflectron

Robert J. Cotter, Ben D. Gardner, Sergei Iltchenko, Robert D. English

Research output: Contribution to journalArticle

Abstract

The unique focusing properties of the curved-field reflectron provide a simple solution to the problem of compensating for the broad range of energies of product ions produced postsource in a time-of-flight mass spectrometer. This has been shown previously for the technique known as postsource decay, but in this report we demonstrate its use for tandem time-of-flight mass spectrometry using a high-performance MALDI time-of-flight instrument modified by the addition of a collision chamber to enable the recording of mass-selected product ions formed by collision-induced dissociation (CID). In particular, the curved-field reflectron enables the use of the full 20-keV kinetic energy provided by the ion source extraction voltage as the collision energy in the laboratory frame and obviates the need to reaccelerate the product ions, using a second "source" or "lift" cell. Results are presented for the collision-induced dissociation of fullerenes over a range of collision gas pressures and precursor ion attenuation. In addition, CID tandem mass spectra are obtained for several peptides.

Original languageEnglish (US)
Pages (from-to)1976-1981
Number of pages6
JournalAnalytical Chemistry
Volume76
Issue number7
DOIs
StatePublished - Apr 1 2004

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Mass spectrometry
Ions
Fullerenes
Mass spectrometers
Ion sources
Kinetic energy
Gases
Peptides
Electric potential

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Tandem Time-of-Flight Mass Spectrometry with a Curved Field Reflectron. / Cotter, Robert J.; Gardner, Ben D.; Iltchenko, Sergei; English, Robert D.

In: Analytical Chemistry, Vol. 76, No. 7, 01.04.2004, p. 1976-1981.

Research output: Contribution to journalArticle

Cotter, Robert J. ; Gardner, Ben D. ; Iltchenko, Sergei ; English, Robert D. / Tandem Time-of-Flight Mass Spectrometry with a Curved Field Reflectron. In: Analytical Chemistry. 2004 ; Vol. 76, No. 7. pp. 1976-1981.
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