Super-resolution two-photon microscopy via scanning patterned illumination

Ben E. Urban, Ji Yi, Siyu Chen, Biqin Dong, Yongling Zhu, Steven H. Devries, Vadim Backman, Hao F. Zhang

Research output: Contribution to journalArticlepeer-review


We developed two-photon scanning patterned illumination microscopy (2P-SPIM) for super-resolution two-photon imaging. Our approach used a traditional two-photon microscopy setup with temporally modulated excitation to create patterned illumination fields. Combing nine different illuminations and structured illumination reconstruction, super-resolution imaging was achieved in two-photon microscopy. Using 2P-SPIM we achieved a lateral resolution of 141 nm, which represents an improvement by a factor of 1.9 over the corresponding diffraction limit. We further demonstrated super-resolution cellular imaging by 2P-SPIM to image actin cytoskeleton in mammalian cells and three-dimensional imaging in highly scattering retinal tissue.

Original languageEnglish (US)
Article number042703
JournalPhysical Review E - Statistical, Nonlinear, and Soft Matter Physics
Issue number4
StatePublished - Apr 7 2015
Externally publishedYes

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Statistics and Probability
  • Condensed Matter Physics


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