Severe growth defect in a Schizosaccharomyces pombe mutant defective in intron lariat degradation

Kiebang Nam, Guiin Lee, Joel Trambley, Scott E. Devine, Jef D. Boeke

Research output: Contribution to journalArticlepeer-review

Abstract

The cDNAs and genes encoding the intron lariat-debranching enzyme were isolated from the nematode Caenorhabditis elegans and the fission yeast Schizosaccharomyces pombe based on their homology with the Saccharomyces cerevisiae gene. The cDNAs were shown to be functional in an interspecific complementation experiment; they can complement an S. cerevisiae dbr1 null mutant. About 2.5% of budding yeast S. cerevisiae genes have introns, and the accumulation of excised introns in a dbr1 null mutant has little effect on cell growth. In contrast, many S. pombe genes contain introns, and often multiple introns per gene, so that S. pombe is estimated to contain ~40 times as many introns as S. cerevisiae. The S. pombe dbr1 gene was disrupted and shown to be nonessential. Like the S. cerevisiae mutant, the S. pombe null mutant accumulated introns to high levels, indicating thai intron lariat debranching represents a rate-limiting step in intron degradation in both species. Unlike the S. cerevisiae mutant, the S. pombe dbr1::leu1+ mutant had a severe growth defect and exhibited an aberrant elongated cell shape in addition to an intron accumulation phenotype. The growth defect of the S. pombe dbr1::leu1+ strain suggests that debranching activity is critical for efficient intron RNA degradation and that blocking this pathway interferes with cell growth.

Original languageEnglish (US)
Pages (from-to)809-818
Number of pages10
JournalMolecular and cellular biology
Volume17
Issue number2
DOIs
StatePublished - Feb 1997

ASJC Scopus subject areas

  • Molecular Biology
  • Cell Biology

Fingerprint Dive into the research topics of 'Severe growth defect in a Schizosaccharomyces pombe mutant defective in intron lariat degradation'. Together they form a unique fingerprint.

Cite this