Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders

Çaǧatay Işil, Mustafa Yorulmaz, Berkan Solmaz, Adil Burak Turhan, Celalettin Yurdakul, Selim Ünlü, Ekmel Ozbay, Aykut Koç

Research output: Contribution to journalArticle

Abstract

Wide-field interferometric microscopy is a highly sensitive, label-free, and low-cost biosensing imaging technique capable of visualizing individual biological nanoparticles such as viral pathogens and exosomes. However, further resolution enhancement is necessary to increase detection and classification accuracy of subdiffraction-limited nanoparticles. In this study, we propose a deep-learning approach, based on coupled deep autoencoders, to improve resolution of images of L-shaped nanostructures. During training, our method utilizes microscope image patches and their corresponding manual truth image patches in order to learn the transformation between them. Following training, the designed network reconstructs denoised and resolution-enhanced image patches for unseen input.

Original languageEnglish (US)
Pages (from-to)2545-2552
Number of pages8
JournalApplied Optics
Volume57
Issue number10
DOIs
StatePublished - Apr 1 2018
Externally publishedYes

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Microscopic examination
Nanoparticles
microscopy
augmentation
Pathogens
Labels
Nanostructures
Microscopes
education
Imaging techniques
nanoparticles
pathogens
imaging techniques
learning
Costs
microscopes
Deep learning

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

Işil, Ç., Yorulmaz, M., Solmaz, B., Turhan, A. B., Yurdakul, C., Ünlü, S., ... Koç, A. (2018). Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders. Applied Optics, 57(10), 2545-2552. https://doi.org/10.1364/AO.57.002545

Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders. / Işil, Çaǧatay; Yorulmaz, Mustafa; Solmaz, Berkan; Turhan, Adil Burak; Yurdakul, Celalettin; Ünlü, Selim; Ozbay, Ekmel; Koç, Aykut.

In: Applied Optics, Vol. 57, No. 10, 01.04.2018, p. 2545-2552.

Research output: Contribution to journalArticle

Işil, Ç, Yorulmaz, M, Solmaz, B, Turhan, AB, Yurdakul, C, Ünlü, S, Ozbay, E & Koç, A 2018, 'Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders', Applied Optics, vol. 57, no. 10, pp. 2545-2552. https://doi.org/10.1364/AO.57.002545
Işil, Çaǧatay ; Yorulmaz, Mustafa ; Solmaz, Berkan ; Turhan, Adil Burak ; Yurdakul, Celalettin ; Ünlü, Selim ; Ozbay, Ekmel ; Koç, Aykut. / Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders. In: Applied Optics. 2018 ; Vol. 57, No. 10. pp. 2545-2552.
@article{bd9a9d87b9844120b0ddf81b721f56a4,
title = "Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders",
abstract = "Wide-field interferometric microscopy is a highly sensitive, label-free, and low-cost biosensing imaging technique capable of visualizing individual biological nanoparticles such as viral pathogens and exosomes. However, further resolution enhancement is necessary to increase detection and classification accuracy of subdiffraction-limited nanoparticles. In this study, we propose a deep-learning approach, based on coupled deep autoencoders, to improve resolution of images of L-shaped nanostructures. During training, our method utilizes microscope image patches and their corresponding manual truth image patches in order to learn the transformation between them. Following training, the designed network reconstructs denoised and resolution-enhanced image patches for unseen input.",
author = "{\cC}aǧatay Işil and Mustafa Yorulmaz and Berkan Solmaz and Turhan, {Adil Burak} and Celalettin Yurdakul and Selim {\"U}nl{\"u} and Ekmel Ozbay and Aykut Ko{\cc}",
year = "2018",
month = "4",
day = "1",
doi = "10.1364/AO.57.002545",
language = "English (US)",
volume = "57",
pages = "2545--2552",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "10",

}

TY - JOUR

T1 - Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders

AU - Işil, Çaǧatay

AU - Yorulmaz, Mustafa

AU - Solmaz, Berkan

AU - Turhan, Adil Burak

AU - Yurdakul, Celalettin

AU - Ünlü, Selim

AU - Ozbay, Ekmel

AU - Koç, Aykut

PY - 2018/4/1

Y1 - 2018/4/1

N2 - Wide-field interferometric microscopy is a highly sensitive, label-free, and low-cost biosensing imaging technique capable of visualizing individual biological nanoparticles such as viral pathogens and exosomes. However, further resolution enhancement is necessary to increase detection and classification accuracy of subdiffraction-limited nanoparticles. In this study, we propose a deep-learning approach, based on coupled deep autoencoders, to improve resolution of images of L-shaped nanostructures. During training, our method utilizes microscope image patches and their corresponding manual truth image patches in order to learn the transformation between them. Following training, the designed network reconstructs denoised and resolution-enhanced image patches for unseen input.

AB - Wide-field interferometric microscopy is a highly sensitive, label-free, and low-cost biosensing imaging technique capable of visualizing individual biological nanoparticles such as viral pathogens and exosomes. However, further resolution enhancement is necessary to increase detection and classification accuracy of subdiffraction-limited nanoparticles. In this study, we propose a deep-learning approach, based on coupled deep autoencoders, to improve resolution of images of L-shaped nanostructures. During training, our method utilizes microscope image patches and their corresponding manual truth image patches in order to learn the transformation between them. Following training, the designed network reconstructs denoised and resolution-enhanced image patches for unseen input.

UR - http://www.scopus.com/inward/record.url?scp=85044867705&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85044867705&partnerID=8YFLogxK

U2 - 10.1364/AO.57.002545

DO - 10.1364/AO.57.002545

M3 - Article

C2 - 29714238

AN - SCOPUS:85044867705

VL - 57

SP - 2545

EP - 2552

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 10

ER -