Predicting immunofluorescence images from reflectance microscopy via deep learning

Shiyi Cheng, Sipei Fu, Yumi Mun Kim, Ji Yi, Lei Tian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To circumvent the limitations of immunofluorescence microscopy, we propose a deep learning approach for characterizing morphological information contained in reflectance microscopy with high specificity and enable digital multiplexing.

Original languageEnglish (US)
Title of host publicationMicroscopy Histopathology and Analytics, Microscopy 2020
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580743
DOIs
StatePublished - 2020
Externally publishedYes
EventMicroscopy Histopathology and Analytics, Microscopy 2020 - Washington, United States
Duration: Apr 20 2020Apr 23 2020

Publication series

NameOptics InfoBase Conference Papers
VolumePart F177-Microscopy-2020
ISSN (Electronic)2162-2701

Conference

ConferenceMicroscopy Histopathology and Analytics, Microscopy 2020
Country/TerritoryUnited States
City Washington
Period4/20/204/23/20

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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