Abstract
A recently developed imaging algorithm based on K-space spectral analysis is used for imaging turbid media. In addition to providing information about position of hidden objects, accurate optical properties of thin heterogeneities can be obtained when information about their depth is available. A new method for determining the background optical properties of an imaged sample and the influence of boundary conditions are discussed.
Original language | English (US) |
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Pages | 88-89 |
Number of pages | 2 |
DOIs | |
State | Published - 1998 |
Externally published | Yes |
Event | Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO - San Francisco, CA, USA Duration: May 3 1998 → May 8 1998 |
Other
Other | Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO |
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City | San Francisco, CA, USA |
Period | 5/3/98 → 5/8/98 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering