Abstract
A technique that combines light scattering spectroscopy with imaging microscopy to track the location of morphologic change within a monolayer of cells was demonstrated. This optical scatter imaging (OSI) technique produces images that directly encode a morphometric parameter within the microscope's full field of view. The OSI method uses Fourier filtering to detect alterations in particle size with wavelength-scale dimensions.
Original language | English (US) |
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Pages | 15 |
Number of pages | 1 |
Volume | 12 |
No | 12 |
Specialist publication | Optics and Photonics News |
DOIs | |
State | Published - Dec 2001 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering