@inproceedings{c73bcb8137224a959cff2c662d1dee53,
title = "Optical fiber sensors fabricated by the focused ion beam technique",
abstract = "Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-P{\'e}rot (FP) refractive index sensor near the tip of a fiber taper, and a highly sensitive in-line temperature sensor in a PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired patterns of air holes in a PCF.",
keywords = "Fiber sensor, Focused ion beam, Lab-on-fiber",
author = "Wu Yuan and Fei Wang and Ole Bang",
year = "2012",
doi = "10.1117/12.974932",
language = "English (US)",
isbn = "9780819491039",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "22nd International Conference on Optical Fiber Sensors",
note = "22nd International Conference on Optical Fiber Sensors ; Conference date: 15-10-2012 Through 19-10-2012",
}