On parameter estimation and goodness-of-fit testing for spatial point patterns

P. J. Diggle

Research output: Contribution to journalArticle

Abstract

The paper discusses the objectives of spatial point pattern analysis, with particular reference to the distinction between mapped and sampled data. For the former case, available models are reviewed briefly, the role of preliminary testing is discussed and a procedure for fitting a parametric model is outlined. A simulation study of several tests of spatial randomness is intended to provide some insight into the suitability for model-fitting of various summary descriptions of a mapped pattern. Two examples illustrate the use of statistical techniques. Some problem areas which merit further investigation are identified.

Original languageEnglish (US)
Pages (from-to)87-101
Number of pages15
JournalBiometrics
Volume35
Issue number1
StatePublished - 1979
Externally publishedYes

Fingerprint

Spatial Point Pattern
Pattern Analysis
Model Fitting
Goodness of fit
Parametric Model
Parameter estimation
Randomness
Parameter Estimation
Simulation Study
Testing
testing
Model
methodology

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Agricultural and Biological Sciences (miscellaneous)
  • Applied Mathematics
  • Statistics and Probability
  • Public Health, Environmental and Occupational Health

Cite this

On parameter estimation and goodness-of-fit testing for spatial point patterns. / Diggle, P. J.

In: Biometrics, Vol. 35, No. 1, 1979, p. 87-101.

Research output: Contribution to journalArticle

@article{f7835966f0e844b1a533add7b97af221,
title = "On parameter estimation and goodness-of-fit testing for spatial point patterns",
abstract = "The paper discusses the objectives of spatial point pattern analysis, with particular reference to the distinction between mapped and sampled data. For the former case, available models are reviewed briefly, the role of preliminary testing is discussed and a procedure for fitting a parametric model is outlined. A simulation study of several tests of spatial randomness is intended to provide some insight into the suitability for model-fitting of various summary descriptions of a mapped pattern. Two examples illustrate the use of statistical techniques. Some problem areas which merit further investigation are identified.",
author = "Diggle, {P. J.}",
year = "1979",
language = "English (US)",
volume = "35",
pages = "87--101",
journal = "Biometrics",
issn = "0006-341X",
publisher = "Wiley-Blackwell",
number = "1",

}

TY - JOUR

T1 - On parameter estimation and goodness-of-fit testing for spatial point patterns

AU - Diggle, P. J.

PY - 1979

Y1 - 1979

N2 - The paper discusses the objectives of spatial point pattern analysis, with particular reference to the distinction between mapped and sampled data. For the former case, available models are reviewed briefly, the role of preliminary testing is discussed and a procedure for fitting a parametric model is outlined. A simulation study of several tests of spatial randomness is intended to provide some insight into the suitability for model-fitting of various summary descriptions of a mapped pattern. Two examples illustrate the use of statistical techniques. Some problem areas which merit further investigation are identified.

AB - The paper discusses the objectives of spatial point pattern analysis, with particular reference to the distinction between mapped and sampled data. For the former case, available models are reviewed briefly, the role of preliminary testing is discussed and a procedure for fitting a parametric model is outlined. A simulation study of several tests of spatial randomness is intended to provide some insight into the suitability for model-fitting of various summary descriptions of a mapped pattern. Two examples illustrate the use of statistical techniques. Some problem areas which merit further investigation are identified.

UR - http://www.scopus.com/inward/record.url?scp=0018332019&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0018332019&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0018332019

VL - 35

SP - 87

EP - 101

JO - Biometrics

JF - Biometrics

SN - 0006-341X

IS - 1

ER -