Noise properties of a kinestatic charge detector

Frank A. Dibianca, Joseph E. Vance, Douglas J. Vagenaar, Joan E. Fetter, Charles R. Tenney, Baijamin M.W. Tsui, Mark S. Reed, David L. McDaniel, Paul Granfors

Research output: Contribution to journalArticle

Abstract

Recent breakthroughs in electronic detector technology have allowed digital radiographic images to become competitive with, or superior to, those produced with classical film-screen techniques. A sunmary of these technologies is given in ref. 1. Our group is involved in the research and development of a recently proposed imaging technology (2, 3) based on the kinestatic charge detector (KCD). The modulation transfer function (MTF) of the KCD technique has been discussed in refs. 1 and 4. The low frequency detective quantum efficiency (DQE(O)) of several KCD designs has been modeled and a value of approximately 0.75 is expected for future detectors (1, 5). In this paper, the noise power spectrum (NPS) and the frequency-dependent DC® (DQE(f)) are discussed. Noise contributions from x-ray quanta (random and structured) and data acquisition electronics are considered and preliminary experimental results are given for a recently installed imaging detector. A brief comparison is made of our theoretical and experimental results with published results for film-screen radiography.

Original languageEnglish (US)
Pages (from-to)212-218
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume914
DOIs
StatePublished - Jun 27 1988
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Dibianca, F. A., Vance, J. E., Vagenaar, D. J., Fetter, J. E., Tenney, C. R., Tsui, B. M. W., Reed, M. S., McDaniel, D. L., & Granfors, P. (1988). Noise properties of a kinestatic charge detector. Proceedings of SPIE - The International Society for Optical Engineering, 914, 212-218. https://doi.org/10.1117/12.968635