Neutron depth profiling by coincidence spectrometry

Nalin R. Parikh, Eric C. Frey, Hans C. Hofsäss, Max L. Swanson, R. Greg Downing, Tim Z. Hossain, Chu Wei-Kan

Research output: Contribution to journalArticlepeer-review

Abstract

The coincidence spectrometry technique developed by Chu and Wu [1,2] was applied to find the depth profile of 25 keV6Li ions implanted into an Al foil, using the 6Li(n, α)3H reaction. The energies of the emitted α and 3H particles were measured in coincidence by two particle detectors mounted on opposite sides of the Al foil. The Li concentration-depth profile was derived by mapping the 4He3 coincidence counts in energy space. Because of the increase in solid angle subtended by the detectors, an improvement of two orders of magnitude in counting statistics could be achieved with no loss of depth resolution. Some suggestions for further improvement are also discussed.

Original languageEnglish (US)
Pages (from-to)70-74
Number of pages5
JournalNuclear Inst. and Methods in Physics Research, B
Volume45
Issue number1-4
DOIs
StatePublished - Jan 2 1990
Externally publishedYes

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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