Model-supported exploitation of synthetic aperture radar images

Rama Chellappa, Shyam Kuttikkad, Reuven Meth, Philippe Burlina, Chandra S. Shekhar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We address the application of model-supported exploitation techniques to synthetic aperture radar (SAR) imagery. The emphasis is on monitoring SAR imagery using wide area 2D and/or 3D site models along with contextual information. We consider here the following tasks useful in monitoring: (a) site model construction using segmentation and labeling techniques, (b) target detection, (c) target classification and indexing, and (d) SAR image-site model registration. The 2-D wide area site models used here for SAR image exploitation differ from typical site models developed for RADIUS applications, in that they do not model specific facilities, but constitute wide area site models of cultural features such as urban clutter areas, roads, clearings, fields, etc. These models may be derived directly from existing site models, possibly constructed from electro-optical (EO) observations. When such models are not available, a set of segmentation and labeling techniques described here can be used for the construction of 2D site models. The use of models can potentially yield critical information which can disambiguate target signatures in SAR images. We address registration of SAR and EO images to a common site model. Specific derivations are given for the case of registration within the RCDE platform. We suggest a constant false alarm rate (CFAR) detection scheme and a topographic primal sketch (TPS) based classification scheme for monitoring target occurrences in SAR images. The TPS of an observed target is matched against candidate targets TPSs synthesized for the preferred target orientation, inferred from context (e.g. road or parking lot targets). Experimental results on real and synthetic SAR images are provided.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsDonald J. Gerson
Pages110-120
Number of pages11
StatePublished - Jan 1 1996
Event24th AIPR Workshop on Tools and Techniques for Modeling and Simulation - Washington, DC, USA
Duration: Oct 11 1995Oct 13 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2645
ISSN (Print)0277-786X

Other

Other24th AIPR Workshop on Tools and Techniques for Modeling and Simulation
CityWashington, DC, USA
Period10/11/9510/13/95

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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