Metal-Enhanced Fluorescence (MEF): Physical characterization of Silver-island films and exploring sample geometries

R. Pribik, A. I. Dragan, Y. Zhang, C. Gaydos, C. D. Geddes

Research output: Contribution to journalArticlepeer-review

Abstract

In this study we have analyzed metal-enhanced fluorescence (MEF) effects from different density Silver-island films (SiFs) and the effects of sample geometry on the observed enhancement of fluorescence (EF). It is shown that silver islands grow exponentially with SiF deposition time (DT < 5 min), optical density of SiFs almost linearly depends on DT; electrical conductivity is zero. At DT > 5 min, silver islands merge, exhibiting a sharp increase in electrical conductivity. It has been shown that the newly proposed SiF sample geometry exhibits higher EF values than the commonly used in MEF studies SiF-SiF sample geometry. The SiF-glass geometry demonstrates high sensitivity for surface immunoassays, a growing application of metal-enhanced fluorescence.

Original languageEnglish (US)
Pages (from-to)70-74
Number of pages5
JournalChemical Physics Letters
Volume478
Issue number1-3
DOIs
StatePublished - Aug 17 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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