TY - JOUR
T1 - Liquid secondary ion mass spectrometry. I. Molecular ion intensities as a function of primary ion pulse frequency
AU - Olthoff, James K.
AU - Cotter, Robert J.
N1 - Funding Information:
Research was supported in part by a grant, GM 33967.f rom the National Institutes of Health.
PY - 1987/6/1
Y1 - 1987/6/1
N2 - A liquid matrix and high primary ion currents are employed on a time-of-flight mass spectrometer to produce molecular ions in a manner similar to that employed for fast atom bombardment (FAB) techniques on sector instruments. The primary ion beam is pulsed and the molecular yield is found to depend upon sample concentration, instantaneous primary ion current, and pulse repetition rate. The latter, in particular, indicates that a finite recovery time is required to repair radiation damage from high flux particle beams.
AB - A liquid matrix and high primary ion currents are employed on a time-of-flight mass spectrometer to produce molecular ions in a manner similar to that employed for fast atom bombardment (FAB) techniques on sector instruments. The primary ion beam is pulsed and the molecular yield is found to depend upon sample concentration, instantaneous primary ion current, and pulse repetition rate. The latter, in particular, indicates that a finite recovery time is required to repair radiation damage from high flux particle beams.
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U2 - 10.1016/0168-583X(87)90544-1
DO - 10.1016/0168-583X(87)90544-1
M3 - Article
AN - SCOPUS:0023363281
SN - 0168-583X
VL - 26
SP - 566
EP - 570
JO - Nuclear Inst. and Methods in Physics Research, B
JF - Nuclear Inst. and Methods in Physics Research, B
IS - 4
ER -