Length determination of DNA fragments in atomic force microscope images

T. S. Spisz, N. D'Costa, C. K. Seymour, J. H. Hoh, R. Reeves, I. N. Bankman

Research output: Contribution to conferencePaperpeer-review

Abstract

A processing algorithm was developed to detect and determine the lengths of DNA fragments in Atomic Force Microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing processing time to provide high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image.

Original languageEnglish (US)
Pages154-157
Number of pages4
StatePublished - Dec 1 1997
EventProceedings of the 1997 International Conference on Image Processing. Part 2 (of 3) - Santa Barbara, CA, USA
Duration: Oct 26 1997Oct 29 1997

Other

OtherProceedings of the 1997 International Conference on Image Processing. Part 2 (of 3)
CitySanta Barbara, CA, USA
Period10/26/9710/29/97

ASJC Scopus subject areas

  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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