Large-area flat-panel amorphous silicon imagers

Larry E. Antonuk, J. Boudry, Y. El-Mohri, W. Huang, Jeff Siewerdsen, John Yorkston, Robert A. Street

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Flat-panel x-ray imaging arrays based upon thin-film electronics are increasingly under development and investigation for a variety of applications. Our research has progressed to the point where three large area designs have now been fabricated, including a new 26 × 26 cm 2 array. These arrays are the largest self-scanning, solid-state imaging arrays thus far reported. In all probability, they represent only the first examples of an entirely new class of real-time imaging devices whose properties offer significant advantages over current radiographic and fluoroscopic x-ray technologies. A general overview of the current state of this emerging imaging technology is presented. Our large area array designs are described and x- ray images from a high resolution array are presented. Future challenges as well as anticipated trends and developments are discussed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRichard L. Van Metter, Jacob Beutel
Pages216-227
Number of pages12
Volume2432
StatePublished - 1995
Externally publishedYes
EventMedical Imaging 1995: Physics of Medical Imaging - San Diego, CA, USA
Duration: Feb 26 1995Feb 27 1995

Other

OtherMedical Imaging 1995: Physics of Medical Imaging
CitySan Diego, CA, USA
Period2/26/952/27/95

Fingerprint

Amorphous silicon
Image sensors
amorphous silicon
Imaging techniques
X rays
general overviews
x rays
Electronic equipment
Scanning
Thin films
emerging
solid state
trends
scanning
high resolution
thin films
electronics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Antonuk, L. E., Boudry, J., El-Mohri, Y., Huang, W., Siewerdsen, J., Yorkston, J., & Street, R. A. (1995). Large-area flat-panel amorphous silicon imagers. In R. L. Van Metter, & J. Beutel (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2432, pp. 216-227)

Large-area flat-panel amorphous silicon imagers. / Antonuk, Larry E.; Boudry, J.; El-Mohri, Y.; Huang, W.; Siewerdsen, Jeff; Yorkston, John; Street, Robert A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Richard L. Van Metter; Jacob Beutel. Vol. 2432 1995. p. 216-227.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Antonuk, LE, Boudry, J, El-Mohri, Y, Huang, W, Siewerdsen, J, Yorkston, J & Street, RA 1995, Large-area flat-panel amorphous silicon imagers. in RL Van Metter & J Beutel (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2432, pp. 216-227, Medical Imaging 1995: Physics of Medical Imaging, San Diego, CA, USA, 2/26/95.
Antonuk LE, Boudry J, El-Mohri Y, Huang W, Siewerdsen J, Yorkston J et al. Large-area flat-panel amorphous silicon imagers. In Van Metter RL, Beutel J, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2432. 1995. p. 216-227
Antonuk, Larry E. ; Boudry, J. ; El-Mohri, Y. ; Huang, W. ; Siewerdsen, Jeff ; Yorkston, John ; Street, Robert A. / Large-area flat-panel amorphous silicon imagers. Proceedings of SPIE - The International Society for Optical Engineering. editor / Richard L. Van Metter ; Jacob Beutel. Vol. 2432 1995. pp. 216-227
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