Implications of using ED-50 and probit analysis in comparing retinal injury threshold data

D. H. Sliney, J. Mellerio, K. Schulmeister

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An indication of the level of uncertainty in laser injury studies relates to the slope of the transformed dose-response curve, or the "probit plot" of the data. The most cited threshold in a laser injury experiment is the point on the probit plot that represents a 50 % probability of injury: the ED-50. This value is frequently referred to as the "threshold", even though some experimental damage points exist below this "threshold." An analysis of any number of example data sets reveals that the slope in most experiments could not be explained by biological variation alone. The optical, thermophysical and biological factors influencing the probit plot are critically analyzed. By theoretically modelling an experiment, small errors in focus are shown to produce a substantial change in the ED-50 and the slope of the probit plot. The implications of plotting spot-size dependence with ED-50 values are shown to be significant, and can lead to erroneous conclusions regarding the apparent spot-size dependence.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsB.E. Stuck, M. Belkin
Pages128-137
Number of pages10
Volume4246
DOIs
Publication statusPublished - 2001
Externally publishedYes
EventLaser and Noncoherent Light Ocular Effects:Epidemiology, Prevention, and Treatment - San Jose, CA, United States
Duration: Jan 22 2001Jan 22 2001

Other

OtherLaser and Noncoherent Light Ocular Effects:Epidemiology, Prevention, and Treatment
CountryUnited States
CitySan Jose, CA
Period1/22/011/22/01

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sliney, D. H., Mellerio, J., & Schulmeister, K. (2001). Implications of using ED-50 and probit analysis in comparing retinal injury threshold data. In B. E. Stuck, & M. Belkin (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4246, pp. 128-137) https://doi.org/10.1117/12.426711