Histopathologic Validation of Fourier-Ellipsometry Measurements of Retinal Nerve Fiber Layer Thickness

Robert N. Weinreb, Andreas W. Dreher, Anne Coleman, Harry A Quigley, Blake Shaw, Klaus Reiter

Research output: Contribution to journalArticle

Abstract

We describe a new technique for the measurement of retinal nerve fiber layer thickness and compare its results with histopathologic measurements in the same eyes. For these studies, two fixed monkey eyes were incised and placed on a pedestal in a plastic viewing dish. The eyes were perfused to maintain a pressure between 10 and 20 mm Hg. An ellipsometer, an optical device used to measure the change in polarization of light (retardation), was implemented in a laser tomographic scanner to obtain polarization data from the two monkey retinas. For the 15 measured locations, retardation ranged between a mean (± SD) of 0.9° ± 1.8° and 23.7° ± 0.3°. Subsequently, retinal nerve fiber layer thickness was measured at the imaged points in epoxy resin-embedded sections by an observer masked to the ellipsometry data. These values ranged between 20.4 μm and 213.9 μm. There was an excellent correlation (R =.83) between retardation and the histopathologic measurement of retinal nerve fiber layer thickness. Quantitating retinal nerve fiber layer thickness may enhance discrimination between glaucomatous and normal eyes earlier than is currently available by anatomic and functional approaches.

Original languageEnglish (US)
Pages (from-to)557-560
Number of pages4
JournalArchives of Ophthalmology
Volume108
Issue number4
DOIs
StatePublished - 1990

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Nerve Fibers
Haplorhini
Epoxy Resins
Optical Devices
Plastics
Retina
Lasers
Light
Pressure

ASJC Scopus subject areas

  • Ophthalmology

Cite this

Histopathologic Validation of Fourier-Ellipsometry Measurements of Retinal Nerve Fiber Layer Thickness. / Weinreb, Robert N.; Dreher, Andreas W.; Coleman, Anne; Quigley, Harry A; Shaw, Blake; Reiter, Klaus.

In: Archives of Ophthalmology, Vol. 108, No. 4, 1990, p. 557-560.

Research output: Contribution to journalArticle

Weinreb, Robert N. ; Dreher, Andreas W. ; Coleman, Anne ; Quigley, Harry A ; Shaw, Blake ; Reiter, Klaus. / Histopathologic Validation of Fourier-Ellipsometry Measurements of Retinal Nerve Fiber Layer Thickness. In: Archives of Ophthalmology. 1990 ; Vol. 108, No. 4. pp. 557-560.
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