High-speed path-length scanning with a multiple-pass cavity delay line

Pei Lin Hsiung, Xingde Li, Christian Chudoba, Ingmar Hartl, Tony H. Ko, James G. Fujimoto

Research output: Contribution to journalArticle

Abstract

Techniques for high-speed delay scanning are important for low-coherence interferometry, optical coherence tomography, pump probe measurements, and other applications. We demonstrate a novel scanning delay line using a multiple-pass cavity. Differential delays are accumulated with each pass so that millimeter delays can be generated with tens of micrometer mirror displacements. With special design criteria, misalignment sensitivity can be dramatically reduced. The system is demonstrated to scan 6 m/s at 2-kHz repetition rates. Real-time optical coherence tomography imaging with 500 pixel images at four frames/s is performed. Using a Cr:forsterite laser source, we obtained axial image resolutions of 6 μm with 92-dB sensitivity.

Original languageEnglish (US)
Pages (from-to)640-648
Number of pages9
JournalApplied Optics
Volume42
Issue number4
DOIs
StatePublished - Feb 1 2003
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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  • Cite this

    Hsiung, P. L., Li, X., Chudoba, C., Hartl, I., Ko, T. H., & Fujimoto, J. G. (2003). High-speed path-length scanning with a multiple-pass cavity delay line. Applied Optics, 42(4), 640-648. https://doi.org/10.1364/AO.42.000640