Global synthetic-lethality analysis and yeast functional profiling

Siew Loon Ooi, Xuewen Pan, Brian D. Peyser, Ping Ye, Pamela B. Meluh, Daniel S. Yuan, Rafael A. Irizarry, Joel S. Bader, Forrest A. Spencer, Jef D. Boeke

Research output: Contribution to journalArticle

Abstract

The Saccharomyces genome-deletion project created >5900 'molecularly barcoded' yeast knockout mutants (YKO mutants). The YKO mutant collections have facilitated large-scale analyses of a multitude of mutant phenotypes. For example, both synthetic genetic array (SGA) and synthetic-lethality analysis by microarray (SLAM) methods have been used for synthetic-lethality screens. Global analysis of synthetic lethality promises to identify cellular pathways that 'buffer' each other biologically. The combination of global synthetic-lethality analysis, together with global protein-protein interaction analyses, mRNA expression profiling and functional profiling will, in principle, enable construction of a cellular 'wiring diagram' that will help frame a deeper understanding of human biology and disease.

Original languageEnglish (US)
Pages (from-to)56-63
Number of pages8
JournalTrends in Genetics
Volume22
Issue number1
DOIs
StatePublished - Jan 2006

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Yeasts
Saccharomyces
Microarray Analysis
Buffers
Proteins
Genome
Phenotype
Messenger RNA
Synthetic Lethal Mutations

ASJC Scopus subject areas

  • Genetics

Cite this

Ooi, S. L., Pan, X., Peyser, B. D., Ye, P., Meluh, P. B., Yuan, D. S., ... Boeke, J. D. (2006). Global synthetic-lethality analysis and yeast functional profiling. Trends in Genetics, 22(1), 56-63. https://doi.org/10.1016/j.tig.2005.11.003

Global synthetic-lethality analysis and yeast functional profiling. / Ooi, Siew Loon; Pan, Xuewen; Peyser, Brian D.; Ye, Ping; Meluh, Pamela B.; Yuan, Daniel S.; Irizarry, Rafael A.; Bader, Joel S.; Spencer, Forrest A.; Boeke, Jef D.

In: Trends in Genetics, Vol. 22, No. 1, 01.2006, p. 56-63.

Research output: Contribution to journalArticle

Ooi, SL, Pan, X, Peyser, BD, Ye, P, Meluh, PB, Yuan, DS, Irizarry, RA, Bader, JS, Spencer, FA & Boeke, JD 2006, 'Global synthetic-lethality analysis and yeast functional profiling', Trends in Genetics, vol. 22, no. 1, pp. 56-63. https://doi.org/10.1016/j.tig.2005.11.003
Ooi, Siew Loon ; Pan, Xuewen ; Peyser, Brian D. ; Ye, Ping ; Meluh, Pamela B. ; Yuan, Daniel S. ; Irizarry, Rafael A. ; Bader, Joel S. ; Spencer, Forrest A. ; Boeke, Jef D. / Global synthetic-lethality analysis and yeast functional profiling. In: Trends in Genetics. 2006 ; Vol. 22, No. 1. pp. 56-63.
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