Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS)

Hans J. Hennes, Baerbel Richter, Carsten Lott, Wolfgang Dick, Stephan Boor, Daniel F Hanley

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Secondary haemorrhage is an important cause of brain injury following initial therapy of subdural haematoma (SDH). Early identification and treatment of secondary haemorrhage improves neurologic outcome. Near infrared light at a wavelength of 760 nm shows a high absorption for haemoglobin. The difference in absorbance of light (ΔOD) at the wavelength of 760 nm between both hemispheres is measured to detect SDH. We have prospectively studied 20 patients with the CT diagnosis of SDH using near infrared spectroscopy (NIRS). Unilateral subdural haematomas were detected by NIRS in 15 out of 16 patients. Bilateral SDH were detected in 2 out of 3 patients. The median of ΔOD was reduced from initially 0.32 (0.05-0.85) to 0.1 (0.02-0.49) at hospital discharge. The complete resorption of the haematoma has been observed in 12 patients by NIRS. In 7 patients we still obtained pathologic values at discharge. The haematomas were not completely resolved, as proved by the CT scans prior to discharge. Our results showed repeated application of NIRS in patients with SDH help to document the clinical course after surgical treatment. Follow-up NIR evaluation of patients with SDH using NIRS may allow early treatment without time delay and a reduction of secondary brain injury as well as treatment costs.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages182-192
Number of pages11
Volume3566
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1998 Photon Propagation in Tissues IV - Stockholm, SWE
Duration: Sep 9 1998Sep 11 1998

Other

OtherProceedings of the 1998 Photon Propagation in Tissues IV
CityStockholm, SWE
Period9/9/989/11/98

Fingerprint

Near infrared spectroscopy
infrared spectroscopy
brain damage
hemorrhages
Brain
Wavelength
Computerized tomography
Hemoglobin
Time delay
hemoglobin
hemispheres
wavelengths
Infrared radiation
therapy
time lag
costs
Costs
evaluation
causes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Hennes, H. J., Richter, B., Lott, C., Dick, W., Boor, S., & Hanley, D. F. (1999). Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS). In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3566, pp. 182-192). Society of Photo-Optical Instrumentation Engineers.

Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS). / Hennes, Hans J.; Richter, Baerbel; Lott, Carsten; Dick, Wolfgang; Boor, Stephan; Hanley, Daniel F.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3566 Society of Photo-Optical Instrumentation Engineers, 1999. p. 182-192.

Research output: Chapter in Book/Report/Conference proceedingChapter

Hennes, HJ, Richter, B, Lott, C, Dick, W, Boor, S & Hanley, DF 1999, Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS). in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3566, Society of Photo-Optical Instrumentation Engineers, pp. 182-192, Proceedings of the 1998 Photon Propagation in Tissues IV, Stockholm, SWE, 9/9/98.
Hennes HJ, Richter B, Lott C, Dick W, Boor S, Hanley DF. Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS). In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3566. Society of Photo-Optical Instrumentation Engineers. 1999. p. 182-192
Hennes, Hans J. ; Richter, Baerbel ; Lott, Carsten ; Dick, Wolfgang ; Boor, Stephan ; Hanley, Daniel F. / Follow-up in patients with subdural haematomas using near infrared spectroscopy (NIRS). Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3566 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 182-192
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