First Born model for reflection-mode Fourier ptychographic microscopy

Alex Matlock, Anne Sentenac, Ji Yi, Lei Tian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We validate a first Born approximation based model for Reflection-mode Fourier ptychography under the semi-infinite boundary condition. Our model enables optical thickness and absorption recovery with enhanced resolution from thin samples.

Original languageEnglish (US)
Title of host publicationMathematics in Imaging, MATH 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
StatePublished - 2018
Externally publishedYes
EventMathematics in Imaging, MATH 2018 - Orlando, United States
Duration: Jun 25 2018Jun 28 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F105-MATH 2018

Conference

ConferenceMathematics in Imaging, MATH 2018
Country/TerritoryUnited States
CityOrlando
Period6/25/186/28/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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