ERP signal estimation from single trial EEG

Hasan Mir, Indu Prasad, Ke Yu, Nitish Thakor, Hasan Al-Nashash

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Non-invasive EEG recordings are subject to effects such as surface conduction, resulting in very low signal to noise ratio (SNR). The conventional approach of using signal averaging to improve the SNR cannot be used for single trial EEG estimation. As such, this paper proposes a beamforming based technique that can be used to improve the signal quality from a signal trial EEG measurement. Results on experimental data show that the proposed technique can successfully isolate the signal of interest from background processes.

Original languageEnglish (US)
Title of host publication2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2989-2992
Number of pages4
ISBN (Electronic)9781424479290
DOIs
StatePublished - Nov 2 2014
Event2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 - Chicago, United States
Duration: Aug 26 2014Aug 30 2014

Publication series

Name2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014

Other

Other2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
CountryUnited States
CityChicago
Period8/26/148/30/14

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ASJC Scopus subject areas

  • Health Informatics
  • Computer Science Applications
  • Biomedical Engineering
  • Medicine(all)

Cite this

Mir, H., Prasad, I., Yu, K., Thakor, N., & Al-Nashash, H. (2014). ERP signal estimation from single trial EEG. In 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 (pp. 2989-2992). [6944251] (2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMBC.2014.6944251