ELECTRICAL IMPEDANCE IMAGING SYSTEM APPLICABLE TO OBJECTS OF ARBITRARY BUT KNOWN BOUNDARY.

Y. Ziya Ider, Cahit Altan, Ergin Atalar, Nevzat G. Gencer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The authors present results obtained by iterative application of the 'backprojection along equipotentials' algorithm for electrical impedance imaging (EII). The forward problem of EII is solved using the finite-element method FEM. Results are presented for the selection of a mesh for FEM, trading accuracy with computation power available. A 1016-triangular-element mesh is found to be optimum. An algorithm is also developed to scale the nodes of the mesh to divide any geometry defined by the positions of the electrodes. Images obtained using data from circular and noncircular 2-D phantoms of known conductivity distributions are presented. It is concluded that for quantitative imaging, iterative application of the method is essential.

Original languageEnglish (US)
Title of host publicationIEEE/Engineering in Medicine and Biology Society Annual Conference
PublisherIEEE
Pages1427-1428
Number of pages2
StatePublished - 1987
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'ELECTRICAL IMPEDANCE IMAGING SYSTEM APPLICABLE TO OBJECTS OF ARBITRARY BUT KNOWN BOUNDARY.'. Together they form a unique fingerprint.

Cite this