Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements

T. Onur Tasci, Ergin Atalar, U. Korcan Demirok, Sefik Suzer

Research output: Contribution to journalArticlepeer-review

Abstract

We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.

Original languageEnglish (US)
Pages (from-to)365-368
Number of pages4
JournalSurface Science
Volume602
Issue number1
DOIs
StatePublished - Jan 1 2008
Externally publishedYes

Keywords

  • Differential charging
  • Modeling and simulation
  • Resistance and capacitance
  • Silicon dioxide layers
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

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