Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements

T. Onur Tasci; Ergin Atalar; U. Korcan Demirok; Sefik Suzer

doi:10.1016/j.susc.2007.10.041

Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements

T. Onur Tasci, Ergin Atalar, U. Korcan Demirok, Sefik Suzer

Research output: Contribution to journal › Article › peer-review

Abstract

We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.

Original language	English (US)
Pages (from-to)	365-368
Number of pages	4
Journal	Surface Science
Volume	602
Issue number	1
DOIs	https://doi.org/10.1016/j.susc.2007.10.041
State	Published - Jan 1 2008
Externally published	Yes

Keywords

Differential charging
Modeling and simulation
Resistance and capacitance
Silicon dioxide layers
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Condensed Matter Physics
Surfaces and Interfaces

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title = "Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements",

abstract = "We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.",

keywords = "Differential charging, Modeling and simulation, Resistance and capacitance, Silicon dioxide layers, X-ray photoelectron spectroscopy",

author = "Tasci, {T. Onur} and Ergin Atalar and Demirok, {U. Korcan} and Sefik Suzer",

year = "2008",

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AU - Tasci, T. Onur

AU - Atalar, Ergin

AU - Demirok, U. Korcan

AU - Suzer, Sefik

PY - 2008/1/1

Y1 - 2008/1/1

N2 - We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.

AB - We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.

KW - Differential charging

KW - Modeling and simulation

KW - Resistance and capacitance

KW - Silicon dioxide layers

KW - X-ray photoelectron spectroscopy

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