Efficient feature embedding of 3D brain MRI images for content-based image retrieval with deep metric learning

Yuto Onga, Shingo Fujiyama, Hayato Arai, Yusuke Chayama, Hitoshi Iyatomi, Kenichi Oishi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Increasing numbers of MRI brain scans, improvements in image resolution, and advancements in MRI acquisition technology are causing significant increases in the demand for and burden on radiologists' efforts in terms of reading and interpreting brain MRIs. Content-based image retrieval (CBIR) is an emerging technology for reducing this burden by supporting the reading of medical images. High dimensionality is a major challenge in developing a CBIR system that is applicable for 3D brain MRIs. In this study, we propose a system called disease-oriented data concentration with metric learning (DDCML). In DDCML, we introduce deep metric learning to a 3D convolutional autoencoder (CAE). Our proposed DDCML scheme achieves a high dimensional compression rate (4096:1) while preserving the disease-related anatomical features that are important for medical image classification. The low-dimensional representation obtained by DDCML improved the clustering performance by 29.1% compared to plain 3D-CAE in terms of discriminating Alzheimer's disease patients from healthy subjects, and successfully reproduced the relationships of the severity of disease categories that were not included in the training.

Original languageEnglish (US)
Title of host publicationProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019
EditorsChaitanya Baru, Jun Huan, Latifur Khan, Xiaohua Tony Hu, Ronay Ak, Yuanyuan Tian, Roger Barga, Carlo Zaniolo, Kisung Lee, Yanfang Fanny Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3764-3769
Number of pages6
ISBN (Electronic)9781728108582
DOIs
StatePublished - Dec 2019
Event2019 IEEE International Conference on Big Data, Big Data 2019 - Los Angeles, United States
Duration: Dec 9 2019Dec 12 2019

Publication series

NameProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019

Conference

Conference2019 IEEE International Conference on Big Data, Big Data 2019
CountryUnited States
CityLos Angeles
Period12/9/1912/12/19

Keywords

  • CAE
  • Dimension Reduction
  • Metric Learning

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Information Systems
  • Information Systems and Management

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