Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy

Shiyi Cheng; Sipei Fu; Yumi Mun Kim; Ji Yi; Lei Tian

doi:10.1109/IPC47351.2020.9252556

Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy

Shiyi Cheng, Sipei Fu, Yumi Mun Kim, Ji Yi, Lei Tian

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

To circumvent the limitations of conventional immunofluorescence (IF) microscopy, a deep learning approach is proposed for transforming morphological information contained in reflectance microscopy to specific and accurate IF prediction with high multiplexing capability.

Original language	English (US)
Title of host publication	2020 IEEE Photonics Conference, IPC 2020 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728158914
DOIs	https://doi.org/10.1109/IPC47351.2020.9252556
State	Published - Sep 2020
Externally published	Yes
Event	2020 IEEE Photonics Conference, IPC 2020 - Virtual, Vancouver, Canada Duration: Sep 28 2020 → Oct 1 2020

Publication series

Name	2020 IEEE Photonics Conference, IPC 2020 - Proceedings

Conference

Conference	2020 IEEE Photonics Conference, IPC 2020
Country/Territory	Canada
City	Virtual, Vancouver
Period	9/28/20 → 10/1/20

ASJC Scopus subject areas

Artificial Intelligence
Computer Networks and Communications
Signal Processing
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/IPC47351.2020.9252556

Cite this

Cheng, S., Fu, S., Kim, Y. M., Yi, J., & Tian, L. (2020). Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy. In 2020 IEEE Photonics Conference, IPC 2020 - Proceedings Article 9252556 (2020 IEEE Photonics Conference, IPC 2020 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPC47351.2020.9252556

Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy. / Cheng, Shiyi; Fu, Sipei; Kim, Yumi Mun et al.
2020 IEEE Photonics Conference, IPC 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2020. 9252556 (2020 IEEE Photonics Conference, IPC 2020 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cheng, S, Fu, S, Kim, YM, Yi, J & Tian, L 2020, Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy. in 2020 IEEE Photonics Conference, IPC 2020 - Proceedings., 9252556, 2020 IEEE Photonics Conference, IPC 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020 IEEE Photonics Conference, IPC 2020, Virtual, Vancouver, Canada, 9/28/20. https://doi.org/10.1109/IPC47351.2020.9252556

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title = "Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy",

abstract = "To circumvent the limitations of conventional immunofluorescence (IF) microscopy, a deep learning approach is proposed for transforming morphological information contained in reflectance microscopy to specific and accurate IF prediction with high multiplexing capability.",

author = "Shiyi Cheng and Sipei Fu and Kim, {Yumi Mun} and Ji Yi and Lei Tian",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 IEEE Photonics Conference, IPC 2020 ; Conference date: 28-09-2020 Through 01-10-2020",

year = "2020",

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doi = "10.1109/IPC47351.2020.9252556",

language = "English (US)",

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M3 - Conference contribution

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Deep-learning-enabled virtual immunofluorescence staining based on reflectance microscopy

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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