Contact resistance estimation for time-dependent silicone elastomer matrix of land grid array socket

Shuang Yang; Ji Wu; Derek Tsai; Michael G. Pecht

doi:10.1109/TCAPT.2007.892075

Contact resistance estimation for time-dependent silicone elastomer matrix of land grid array socket

Shuang Yang, Ji Wu, Derek Tsai, Michael G. Pecht

School of Medicine

Research output: Contribution to journal › Article › peer-review

Abstract

A land grid array (LGA) socket provides high- density, electrically-separable interconnect between a component and a printed circuit board. The LGA socket must not be susceptible to creep and stress relaxation, which can lead to loss of contact force and consequently the degradation of contact resistance. In this paper, the time-dependent contact resistance failure mechanisms were experimentally assessed and theoretically analyzed for silicone elastomer matrix socket interconnects. A time-dependent physics-of-failure model was developed for contact resistance simulation.

Original language	English (US)
Pages (from-to)	81-85
Number of pages	5
Journal	IEEE Transactions on Components and Packaging Technologies
Volume	30
Issue number	1
DOIs	https://doi.org/10.1109/TCAPT.2007.892075
State	Published - Mar 1 2007

Keywords

Contact force
Contact resistance
Creep
Land grid array (LGA)
Socket
Stress relaxation

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/TCAPT.2007.892075

Fingerprint Dive into the research topics of 'Contact resistance estimation for time-dependent silicone elastomer matrix of land grid array socket'. Together they form a unique fingerprint.

Cite this

@article{bee73021910c45a4af5d1ddc0c05169b,

title = "Contact resistance estimation for time-dependent silicone elastomer matrix of land grid array socket",

abstract = "A land grid array (LGA) socket provides high- density, electrically-separable interconnect between a component and a printed circuit board. The LGA socket must not be susceptible to creep and stress relaxation, which can lead to loss of contact force and consequently the degradation of contact resistance. In this paper, the time-dependent contact resistance failure mechanisms were experimentally assessed and theoretically analyzed for silicone elastomer matrix socket interconnects. A time-dependent physics-of-failure model was developed for contact resistance simulation.",

keywords = "Contact force, Contact resistance, Creep, Land grid array (LGA), Socket, Stress relaxation",

author = "Shuang Yang and Ji Wu and Derek Tsai and Pecht, {Michael G.}",

year = "2007",

month = mar,

day = "1",

doi = "10.1109/TCAPT.2007.892075",

language = "English (US)",

volume = "30",

pages = "81--85",

journal = "IEEE Transactions on Components and Packaging Technologies",

issn = "1521-3331",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Contact resistance estimation for time-dependent silicone elastomer matrix of land grid array socket

AU - Yang, Shuang

AU - Wu, Ji

AU - Tsai, Derek

AU - Pecht, Michael G.

PY - 2007/3/1

Y1 - 2007/3/1

N2 - A land grid array (LGA) socket provides high- density, electrically-separable interconnect between a component and a printed circuit board. The LGA socket must not be susceptible to creep and stress relaxation, which can lead to loss of contact force and consequently the degradation of contact resistance. In this paper, the time-dependent contact resistance failure mechanisms were experimentally assessed and theoretically analyzed for silicone elastomer matrix socket interconnects. A time-dependent physics-of-failure model was developed for contact resistance simulation.

AB - A land grid array (LGA) socket provides high- density, electrically-separable interconnect between a component and a printed circuit board. The LGA socket must not be susceptible to creep and stress relaxation, which can lead to loss of contact force and consequently the degradation of contact resistance. In this paper, the time-dependent contact resistance failure mechanisms were experimentally assessed and theoretically analyzed for silicone elastomer matrix socket interconnects. A time-dependent physics-of-failure model was developed for contact resistance simulation.

KW - Contact force

KW - Contact resistance

KW - Creep

KW - Land grid array (LGA)

KW - Socket

KW - Stress relaxation

UR - http://www.scopus.com/inward/record.url?scp=34147171453&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34147171453&partnerID=8YFLogxK

U2 - 10.1109/TCAPT.2007.892075

DO - 10.1109/TCAPT.2007.892075

M3 - Article

AN - SCOPUS:34147171453

VL - 30

SP - 81

EP - 85

JO - IEEE Transactions on Components and Packaging Technologies

JF - IEEE Transactions on Components and Packaging Technologies

SN - 1521-3331

IS - 1

ER -