COMBINATION FIELD DESORPTION/FAST ATOM BOMBARDMENT SOURCE FOR THE MS-50 MASS SPECTROMETER.

G. Hansen, D. Heller, J. Yergey, Robert J. Cotter, C. Fenselau

Research output: Contribution to journalArticle

Abstract

Conversion of the combination EI/FD source supplied by Kratos for the MS-50 mass spectrometer to a combination FD/FAB source is described. Sensitivities in the combination source are equivalent to those of the stand alone FAB source supplied by Kratos and the EI/FD source. Some compounds could be analyzed by FAB only, others by FD only and a third group were susceptible to both techniques. The advantage of the combination source is that both techniques may be used without having to change ion sources or perform extensive instrumental manipulations.

Original languageEnglish (US)
Pages (from-to)275-288
Number of pages14
JournalChemical, Biomedical, and Environmental Instrumentation
Volume12
Issue number4
StatePublished - 1982
Externally publishedYes

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Mass spectrometers
Ion sources
mass spectrometers
bombardment
Desorption
desorption
spectrometer
Atoms
FORTRAN
ion
atoms
ion sources
manipulators
sensitivity

ASJC Scopus subject areas

  • Engineering(all)

Cite this

COMBINATION FIELD DESORPTION/FAST ATOM BOMBARDMENT SOURCE FOR THE MS-50 MASS SPECTROMETER. / Hansen, G.; Heller, D.; Yergey, J.; Cotter, Robert J.; Fenselau, C.

In: Chemical, Biomedical, and Environmental Instrumentation, Vol. 12, No. 4, 1982, p. 275-288.

Research output: Contribution to journalArticle

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