Calibration of optical lever sensitivity for atomic force microscopy

Neill P. D'Costa, Jan H. Hoh

Research output: Contribution to journalArticle

Abstract

Accurate force determinations in atomic force microscopy require the precise measurement of cantilever deflections. A limiting factor in making these measurements is the calibration of the optical lever detection system, particularly when the tip cannot be pressed against a hard surface. Here we show that, for a given instrument, a fixed displacement of the photodiode detector produces a change in the detector voltage that correlates strongly with optical lever sensitivity. This provides a simple method for optical lever sensitivity calibration not requiring contact of the tip with any surface. The data also suggest that differences in the shape of the laser spot on the photodiode are a major source of variability in optical lever sensitivity.

Original languageEnglish (US)
Pages (from-to)5096-5097
Number of pages2
JournalReview of Scientific Instruments
Volume66
Issue number10
DOIs
StatePublished - 1995

Fingerprint

levers
Photodiodes
Atomic force microscopy
atomic force microscopy
Calibration
Detectors
sensitivity
photodiodes
Lasers
detectors
Electric potential
deflection
electric potential
lasers

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Calibration of optical lever sensitivity for atomic force microscopy. / D'Costa, Neill P.; Hoh, Jan H.

In: Review of Scientific Instruments, Vol. 66, No. 10, 1995, p. 5096-5097.

Research output: Contribution to journalArticle

D'Costa, Neill P. ; Hoh, Jan H. / Calibration of optical lever sensitivity for atomic force microscopy. In: Review of Scientific Instruments. 1995 ; Vol. 66, No. 10. pp. 5096-5097.
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