Assessment of Spinal Cord Injury via Sparse Modeling of Somatosensory Evoked Potential Signals

H. Mir, H. Al-Nashash, J. Kortelainen, Angelo Homayoun All

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The morphological differences between somatosensory evoked potential (SEP) signals from a normal spinal pathway and spinal pathway affected by spinal cord injury (SCI) provide an indication of the degree of SCI. A sparse representation of the fit between these signals is proposed in this paper as an SCI assessment method. The proposed method is tested on actual SEP signals collected from rodents that have been subjected to spinal transection. Results indicate that the proposed method provides a robust measure of the different degrees of SCI resulting from transection of the spinal cord.

Original languageEnglish (US)
Title of host publicationAMS 2017 - Asia Modelling Symposium 2017 and 11th International Conference on Mathematical Modelling and Computer Simulation
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages13-17
Number of pages5
ISBN (Print)9781538637524
DOIs
StatePublished - Aug 1 2018
Event2017 Asia Modelling Symposium, AMS 2017 and 11th International Conference on Mathematical Modelling and Computer Simulation - Kota Kinabalu, Sabah, Malaysia
Duration: Dec 4 2017Dec 6 2017

Other

Other2017 Asia Modelling Symposium, AMS 2017 and 11th International Conference on Mathematical Modelling and Computer Simulation
CountryMalaysia
CityKota Kinabalu, Sabah
Period12/4/1712/6/17

Keywords

  • Somatosensory Evoked Potential (SEP)
  • Spinal Cord Injury (SCI)

ASJC Scopus subject areas

  • Computer Science Applications
  • Modeling and Simulation

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  • Cite this

    Mir, H., Al-Nashash, H., Kortelainen, J., & All, A. H. (2018). Assessment of Spinal Cord Injury via Sparse Modeling of Somatosensory Evoked Potential Signals. In AMS 2017 - Asia Modelling Symposium 2017 and 11th International Conference on Mathematical Modelling and Computer Simulation (pp. 13-17). [8424281] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AMS.2017.11