Application of trace-norm and low-rank matrix decomposition for computational anatomy

Nematollah Batmanghelich, Ali Gooya, Stathis Kanterakis, Ben Taskar, Christos Davatzikos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We propose a generative model to distinguish normal anatomical variations from abnormal deformations given a group of images with normal and abnormal subjects. We assume that abnormal subjects share common factors which characterize the abnormality. These factors are hard to discover due to large variance of normal anatomical differences. Assuming that the deformation fields are parametrized by their stationary velocity fields, these factors constitute a low-rank subspace (abnormal space) that is corrupted by high variance normal anatomical differences. We assume that these normal anatomical variations are not correlated. We form an optimization problem and propose an efficient iterative algorithm to recover the low-rank subspace. The algorithm iterates between image registration and the decomposition steps and hence can be seen as a group-wise registration algorithm. We apply our method on synthetic and real data and discover abnormality of the population that cannot be recovered by some of the well-known matrix decompositions (e.g. Singular Value Decomposition).

Original languageEnglish (US)
Title of host publication2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops, CVPRW 2010
Pages146-153
Number of pages8
DOIs
StatePublished - Sep 17 2010
Event2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops, CVPRW 2010 - San Francisco, CA, United States
Duration: Jun 13 2010Jun 18 2010

Publication series

Name2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops, CVPRW 2010

Other

Other2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops, CVPRW 2010
Country/TerritoryUnited States
CitySan Francisco, CA
Period6/13/106/18/10

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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