APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY.

Robert J. Cotter, David Heller, James Yergey

Research output: Contribution to conferencePaper

Original languageEnglish (US)
Pages589-590
Number of pages2
StatePublished - Dec 1 1983

ASJC Scopus subject areas

  • Engineering(all)

Cite this