APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY.

Robert J. Cotter, David Heller, James Yergey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationAnnual Conference on Mass Spectrometry and Allied Topics
PublisherAmerican Soc for Mass Spectrometry
Pages589-590
Number of pages2
StatePublished - 1983
Externally publishedYes

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Mass spectrometry
Desorption
Ions

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Cotter, R. J., Heller, D., & Yergey, J. (1983). APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY. In Annual Conference on Mass Spectrometry and Allied Topics (pp. 589-590). American Soc for Mass Spectrometry.

APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY. / Cotter, Robert J.; Heller, David; Yergey, James.

Annual Conference on Mass Spectrometry and Allied Topics. American Soc for Mass Spectrometry, 1983. p. 589-590.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cotter, RJ, Heller, D & Yergey, J 1983, APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY. in Annual Conference on Mass Spectrometry and Allied Topics. American Soc for Mass Spectrometry, pp. 589-590.
Cotter RJ, Heller D, Yergey J. APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY. In Annual Conference on Mass Spectrometry and Allied Topics. American Soc for Mass Spectrometry. 1983. p. 589-590
Cotter, Robert J. ; Heller, David ; Yergey, James. / APPEARANCE OF DOUBLY-CHARGED IONS AS A MEASURE OF FIELD EFFECTS IN DESORPTION MASS SPECTROMETRY. Annual Conference on Mass Spectrometry and Allied Topics. American Soc for Mass Spectrometry, 1983. pp. 589-590
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author = "Cotter, {Robert J.} and David Heller and James Yergey",
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