Apoptosis detection in brain using low-magnification dark-field microscopy

Mary S. Lange, Michael V Johnston, Elaine E. Tseng, William A Baumgartner, Mary E Blue

Research output: Contribution to journalArticle

Abstract

Apoptosis or programmed cell death is a feature of normal brain development and a response to brain injury. Cells undergoing apoptosis have a characteristic morphology that normally can only be appreciated at high magnification. Using dark-field transmitted light microscopy to examine Nissl-stained material, we detected groups of apoptotic cells at much lower magnifications than often were required in the two injury models we tested. This method was useful for screening entire brain sections to assess regional and global patterns of injury. We predict that this technique in which we detect the clumped chromatin associated with apoptosis can be applied to other types of tissue.

Original languageEnglish (US)
Pages (from-to)254-260
Number of pages7
JournalExperimental Neurology
Volume158
Issue number1
DOIs
StatePublished - Jul 1999

Fingerprint

Microscopy
Apoptosis
Brain
Wounds and Injuries
Brain Injuries
Chromatin
Cell Death
Light

Keywords

  • Development
  • Ischemia
  • Nissl neuropathology
  • Programmed cell death

ASJC Scopus subject areas

  • Neurology
  • Neuroscience(all)

Cite this

Apoptosis detection in brain using low-magnification dark-field microscopy. / Lange, Mary S.; Johnston, Michael V; Tseng, Elaine E.; Baumgartner, William A; Blue, Mary E.

In: Experimental Neurology, Vol. 158, No. 1, 07.1999, p. 254-260.

Research output: Contribution to journalArticle

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