An iterative approach to sinogram restoration

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The author presents a projection-space method for reconstruction from limited-angle, sparse-angle, and noisy projections. A variational problem, formulated in projection-space; incorporates consistency of the projections using constraints, convex support as a penalty on sinogram values, and sinogram smoothness through spatially varying horizontal and vertical smoothing coefficients. Specification of the vertical smoothing coefficient requires the convex support and an a priori expectation of the object's profile within its convex support. The horizontal smoothing coefficient is chosen heuristically to help account for the absence of observed projections. Simulation results are presented.

Original languageEnglish (US)
Title of host publicationBiomedical Engineering Perspectives
Subtitle of host publicationHealth Care Technologies for the 1990's and Beyond
PublisherPubl by IEEE
Pages366-367
Number of pages2
Editionpt 1
ISBN (Print)0879425598
StatePublished - Dec 1 1990
EventProceedings of the 12th Annual International Conference of the IEEE Engineering in Medicine and Biology Society - Philadelphia, PA, USA
Duration: Nov 1 1990Nov 4 1990

Publication series

NameProceedings of the Annual Conference on Engineering in Medicine and Biology
Numberpt 1
ISSN (Print)0589-1019

Other

OtherProceedings of the 12th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
CityPhiladelphia, PA, USA
Period11/1/9011/4/90

ASJC Scopus subject areas

  • Signal Processing
  • Biomedical Engineering
  • Computer Vision and Pattern Recognition
  • Health Informatics

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  • Cite this

    Prince, J. L. (1990). An iterative approach to sinogram restoration. In Biomedical Engineering Perspectives: Health Care Technologies for the 1990's and Beyond (pt 1 ed., pp. 366-367). (Proceedings of the Annual Conference on Engineering in Medicine and Biology; No. pt 1). Publ by IEEE.