An approach to the analysis of repeated measurements

P. J. Diggle

Research output: Contribution to journalArticle

Abstract

A linear model for repeated measurements is proposed in which the correlation structure within each time sequence of measurements includes parameters for measurement error, variation between experimental units, and serial correlation within units. An approach to data analysis is presented which involves preliminary analysis by ordinary least squares, use of the empirical semi-variogram of residuals to suggest a suitable correlation structure, and formal inference using likelihood-based methods. Applications to two biological data sets are described.

Original languageEnglish (US)
Pages (from-to)959-971
Number of pages13
JournalBiometrics
Volume44
Issue number4
StatePublished - 1988
Externally publishedYes

Fingerprint

Repeated Measurements
Correlation Structure
Least-Squares Analysis
Linear Models
Semivariogram
Serial Correlation
Likelihood Inference
Unit
Ordinary Least Squares
Measurement errors
Measurement Error
Linear Model
Data analysis
autocorrelation
least squares
data analysis
linear models
Datasets
methodology

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Agricultural and Biological Sciences (miscellaneous)
  • Applied Mathematics
  • Statistics and Probability
  • Public Health, Environmental and Occupational Health

Cite this

Diggle, P. J. (1988). An approach to the analysis of repeated measurements. Biometrics, 44(4), 959-971.

An approach to the analysis of repeated measurements. / Diggle, P. J.

In: Biometrics, Vol. 44, No. 4, 1988, p. 959-971.

Research output: Contribution to journalArticle

Diggle, PJ 1988, 'An approach to the analysis of repeated measurements', Biometrics, vol. 44, no. 4, pp. 959-971.
Diggle, P. J. / An approach to the analysis of repeated measurements. In: Biometrics. 1988 ; Vol. 44, No. 4. pp. 959-971.
@article{9eeb04883d824df18626106f6bd933aa,
title = "An approach to the analysis of repeated measurements",
abstract = "A linear model for repeated measurements is proposed in which the correlation structure within each time sequence of measurements includes parameters for measurement error, variation between experimental units, and serial correlation within units. An approach to data analysis is presented which involves preliminary analysis by ordinary least squares, use of the empirical semi-variogram of residuals to suggest a suitable correlation structure, and formal inference using likelihood-based methods. Applications to two biological data sets are described.",
author = "Diggle, {P. J.}",
year = "1988",
language = "English (US)",
volume = "44",
pages = "959--971",
journal = "Biometrics",
issn = "0006-341X",
publisher = "Wiley-Blackwell",
number = "4",

}

TY - JOUR

T1 - An approach to the analysis of repeated measurements

AU - Diggle, P. J.

PY - 1988

Y1 - 1988

N2 - A linear model for repeated measurements is proposed in which the correlation structure within each time sequence of measurements includes parameters for measurement error, variation between experimental units, and serial correlation within units. An approach to data analysis is presented which involves preliminary analysis by ordinary least squares, use of the empirical semi-variogram of residuals to suggest a suitable correlation structure, and formal inference using likelihood-based methods. Applications to two biological data sets are described.

AB - A linear model for repeated measurements is proposed in which the correlation structure within each time sequence of measurements includes parameters for measurement error, variation between experimental units, and serial correlation within units. An approach to data analysis is presented which involves preliminary analysis by ordinary least squares, use of the empirical semi-variogram of residuals to suggest a suitable correlation structure, and formal inference using likelihood-based methods. Applications to two biological data sets are described.

UR - http://www.scopus.com/inward/record.url?scp=0024205607&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024205607&partnerID=8YFLogxK

M3 - Article

C2 - 3233259

AN - SCOPUS:0024205607

VL - 44

SP - 959

EP - 971

JO - Biometrics

JF - Biometrics

SN - 0006-341X

IS - 4

ER -