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A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions
Thomas D. Murray, Artem Y. Lyubimov, Craig M. Ogata, Huy Vo, Monarin Uervirojnangkoorn, Axel T. Brunger, James M. Berger
Research output: Contribution to journal › Article › peer-review
47
Scopus
citations